Authors:
HUISINGA M
BOUCHAALA N
BENNEWITZ R
KOTOMIN EA
REICHLING M
KUZOVKOV VN
VONNIESSEN W
Citation: M. Huisinga et al., THE KINETICS OF CAF2 METALLIZATION INDUCED BY LOW-ENERGY-ELECTRON IRRADIATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 141(1-4), 1998, pp. 79-84
Citation: M. Huisinga et al., PHOTOEMISSION FROM PURE AND ELECTRON-IRRADIATED CAF2, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 141(1-4), 1998, pp. 528-532
Citation: M. Reichling et al., ELECTRON-STIMULATED AND PHOTON-STIMULATED METALLIZATION AND OXIDATIONOF THE CAF2(111) SURFACE, Surface science, 404(1-3), 1998, pp. 145-149
Authors:
BOUCHAALA N
KOTOMIN EA
KUZOVKOV VN
REICHLING M
Citation: N. Bouchaala et al., F-CENTER AGGREGATION KINETICS IN LOW-ENERGY-ELECTRON IRRADIATED LIF, Solid state communications, 108(9), 1998, pp. 629-633
Authors:
PUCHINA AV
PUCHIN VE
KOTOMIN EA
REICHLING M
Citation: Av. Puchina et al., AB-INITIO STUDY OF THE F-CENTERS IN CAF2 - CALCULATIONS OF THE OPTICAL-ABSORPTION, DIFFUSION AND BINDING-ENERGIES, Solid state communications, 106(5), 1998, pp. 285-288
Citation: J. Hartmann et al., INFLUENCE OF THERMAL BARRIERS ON HEAT-FLOW IN HIGH-QUALITY CHEMICAL-VAPOR-DEPOSITED DIAMOND, Physical review letters, 80(1), 1998, pp. 117-120
Citation: M. Reichling et al., LOCAL VARIATION OF ROOM-TEMPERATURE THERMAL-CONDUCTIVITY IN HIGH-QUALITY POLYCRYSTALLINE DIAMOND, Applied physics letters, 73(6), 1998, pp. 756-758
Authors:
STENZEL E
GOGOLL S
SILS J
HUISINGA M
JOHANSEN H
KASTNER G
REICHLING M
MATTHIAS E
Citation: E. Stenzel et al., LASER DAMAGE OF ALKALINE-EARTH FLUORIDES AT 248 NM AND THE INFLUENCE OF POLISHING GRADES, Applied surface science, 110, 1997, pp. 162-167
Citation: M. Huisinga et al., ULTRAVIOLET PHOTOELECTRON-SPECTROSCOPY AND PHOTOCONDUCTIVITY OF CAF2, Physical review. B, Condensed matter, 55(12), 1997, pp. 7600-7605
Authors:
JOHANSEN H
ERFURTH W
GOGOLL S
STENZEL E
REICHLING M
MATTIAS E
Citation: H. Johansen et al., SCANNING ELECTRON-MICROSCOPY IMAGING OF MICROCRACKS AND CHARGING PHENOMENA ON A LASER-DAMAGED CAF2 SURFACE, Scanning, 19(6), 1997, pp. 416-425
Citation: R. Bennewitz et al., FORCE MICROSCOPY OF CLEAVED AND ELECTRON-IRRADIATED CAF2(111) SURFACES IN ULTRA-HIGH-VACUUM, Surface science, 387(1-3), 1997, pp. 69-77
Citation: G. Langer et al., THERMAL-CONDUCTIVITY OF THIN METALLIC-FILMS MEASURED BY PHOTOTHERMAL PROFILE ANALYSIS, Review of scientific instruments, 68(3), 1997, pp. 1510-1513
Authors:
LEBLANS M
THOMA RKR
LOPRESTI JL
REICHLING M
WILLIAMS RT
Citation: M. Leblans et al., FEMTOSECOND TIME-RESOLVED PHOTOELECTRON-SPECTROSCOPY OF ANNEALED AND SPUTTERED GAP(110), Journal of luminescence, 72-4, 1997, pp. 108-109
Citation: J. Hartmann et al., MEASURING LOCAL THERMAL-CONDUCTIVITY IN POLYCRYSTALLINE DIAMOND WITH A HIGH-RESOLUTION PHOTOTHERMAL MICROSCOPE, Journal of applied physics, 81(7), 1997, pp. 2966-2972
Citation: M. Reichling et al., QUANTITATIVE THERMAL IMAGING OF CURRENT DENSITIES AND HEAT-FLOW IN ELECTRONIC MICROSTRUCTURES, Progress in Natural Science, 6, 1996, pp. 519-523
Authors:
HARTMANN J
VOIGT P
REICHLING M
MATTHIAS E
Citation: J. Hartmann et al., PHOTOTHERMAL MEASUREMENT OF THERMAL ANISOTROPY IN PYROLYTIC-GRAPHITE, Applied physics. B, Lasers and optics, 62(5), 1996, pp. 493-497
Authors:
VERHOEVEN H
HARTMANN J
REICHLING M
MULLERSEBERT W
ZACHAI R
Citation: H. Verhoeven et al., STRUCTURAL LIMITATIONS TO LOCAL THERMAL DIFFUSIVITIES OF DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 5(9), 1996, pp. 1012-1016
Authors:
GOGOLL S
STENZEL E
JOHANSEN H
REICHLING M
MATTHIAS E
Citation: S. Gogoll et al., LASER-DAMAGE OF CLEAVED AND POLISHED CAF2 AT 248-NM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 116(1-4), 1996, pp. 279-283
Authors:
REICHLING M
WILSON RM
BENNEWITZ R
WILLIAMS RT
GOGOLL S
STENZEL E
MATTHIAS E
Citation: M. Reichling et al., SURFACE COLLOID EVOLUTION DURING LOW-ENERGY-ELECTRON IRRADIATION OF CAF2(111), Surface science, 366(3), 1996, pp. 531-544
Authors:
JOHANSEN H
GOGOLL S
STENZEL E
REICHLING M
MATTHIAS E
Citation: H. Johansen et al., CHARGING PHENOMENA IN LOW-VOLTAGE ELECTRON-MICROSCOPY OF LASER-FRACTURED FLUORIDE SURFACES, Journal of applied physics, 80(9), 1996, pp. 4928-4933