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Results:
1-16
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Results: 16
Authors:
TANAKA T
REK ZU
WONG J
ROWEN M
Citation: T. Tanaka et al., FZ CRYSTAL-GROWTH OF MONOCHROMATOR-GRADE YB66 SINGLE-CRYSTALS AS GUIDED BY TOPOGRAPHIC AND DOUBLE-CRYSTAL DIFFRACTION CHARACTERIZATION, Journal of crystal growth, 192(1-2), 1998, pp. 141-151
Authors:
WHITACRE JF
REK ZU
BILELLO JC
YALISOVE SM
Citation: Jf. Whitacre et al., SURFACE-ROUGHNESS AND INPLANE TEXTURING IN SPUTTERED THIN-FILMS, Journal of applied physics, 84(3), 1998, pp. 1346-1353
Authors:
TSURUTA H
BRENNAN S
REK ZU
IRVING TC
TOMPKINS WH
HODGSON KO
Citation: H. Tsuruta et al., A WIDE-BANDPASS MULTILAYER MONOCHROMATOR FOR BIOLOGICAL SMALL-ANGLE SCATTERING AND FIBER DIFFRACTION STUDIES, Journal of applied crystallography, 31, 1998, pp. 672-682
Authors:
MALHOTRA SG
REK ZU
YALISOVE SM
BILELLO JC
Citation: Sg. Malhotra et al., STRAIN GRADIENTS AND NORMAL STRESSES IN TEXTURED MO THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(2), 1997, pp. 345-352
Authors:
MALHOTRA SG
REK ZU
YALISOVE SM
BILELLO JC
Citation: Sg. Malhotra et al., ANALYSIS OF THIN-FILM STRESS MEASUREMENT TECHNIQUES, Thin solid films, 301(1-2), 1997, pp. 45-54
Authors:
TANAKA T
AIZAWA T
ROWEN M
REK ZU
KITAJIMA Y
HIGASHI I
WONG J
ISHIZAWA Y
Citation: T. Tanaka et al., NATURE OF THE 1385.6 AND 1438 EV POSITIVE GLITCHES IN THE TRANSMISSION FUNCTION OF THE YB66 SOFT-X-RAY MONOCHROMATOR, Journal of applied crystallography, 30, 1997, pp. 87-91
Authors:
NEUMANN HB
SCHNEIDER JR
SUSSENBACH J
STOCK SR
REK ZU
Citation: Hb. Neumann et al., SI-TASI2 IN-SITU COMPOSITES - A NEW MONOC HROMATOR MATERIAL FOR HARD X-RAYS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 372(3), 1996, pp. 551-555
Authors:
DEYOREO JJ
REK ZU
ZAITSEVA NP
WOODS BW
Citation: Jj. Deyoreo et al., SOURCES OF OPTICAL DISTORTION IN RAPIDLY GROWN CRYSTALS OF KH2PO4, Journal of crystal growth, 166(1-4), 1996, pp. 291-297
Authors:
STOCK SR
REK ZU
GOORSKY MS
Citation: Sr. Stock et al., CHARACTERIZATION OF TASI2-SI COMPOSITES FOR USE AS WIDE-BANDPASS OPTICAL-ELEMENTS FOR SYNCHROTRON-RADIATION, Journal of applied physics, 79(9), 1996, pp. 6803-6810
Authors:
MALHOTRA SG
REK ZU
YALISOVE SM
BILELLO JC
Citation: Sg. Malhotra et al., DEPTH DEPENDENCE OF RESIDUAL STRAINS IN POLYCRYSTALLINE MO THIN-FILMSUSING HIGH-RESOLUTION X-RAY-DIFFRACTION, Journal of applied physics, 79(9), 1996, pp. 6872-6879
Authors:
WONG J
REK ZU
ROWEN M
TANAKA T
SCHAFERS F
MULLER B
GEORGE GN
PICKERING IJ
VIA G
DEVRIES B
BROWN GE
FROBA M
Citation: J. Wong et al., NEW OPPORTUNITIES IN 1-2-KEV SPECTROSCOPY, Physica. B, Condensed matter, 209(1-4), 1995, pp. 220-222
Authors:
ADAMS DP
PARFITT LJ
BILELLO JC
YALISOVE SM
REK ZU
Citation: Dp. Adams et al., MICROSTRUCTURE AND RESIDUAL-STRESS OF VERY THIN MO FILMS, Thin solid films, 266(1), 1995, pp. 52-57
Authors:
BILELLO JC
YALISOVE SM
REK ZU
Citation: Jc. Bilello et al., THE EVOLUTION OF TEXTURE IN THIN-FILMS AND MULTILAYERS VIA SYNCHROTRON TRANSMISSION LAUE AND GRAZING-INCIDENCE X-RAY-SCATTERING, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 295-300
Authors:
VILL MA
REK ZU
YALISOVE SM
BILELLO JC
Citation: Ma. Vill et al., GROWTH TEXTURES OF THICK SPUTTERED FILMS AND MULTILAYERS ASSESSED VIASYNCHROTRON TRANSMISSION LAUE, Journal of applied physics, 78(6), 1995, pp. 3812-3819
Authors:
WONG J
GEORGE GN
PICKERING IJ
REK ZU
ROWEN M
TANAKA T
VIA GH
DEVRIES B
VAUGHAN DEW
BROWN GE
Citation: J. Wong et al., NEW OPPORTUNITIES IN XAFS INVESTIGATION IN THE 1-2-KEV REGION, Solid state communications, 92(7), 1994, pp. 559-562
Authors:
WONG J
GEORGE GN
PICKERING IJ
REK ZU
ROWEN M
TANAKA T
VIA GH
DEVRIES B
VAUGHAN DEW
BROWN GE
Citation: J. Wong et al., NEW OPPORTUNITIES IN XAFS INVESTIGATION IN THE 1-2-KEV REGION, Solid state communications, 92(7), 1994, pp. 559-562
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