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Citation: Ja. Dura et al., NEUTRON REFLECTOMETRY, X-RAY REFLECTOMETRY, AND SPECTROSCOPIC ELLIPSOMETRY CHARACTERIZATION OF THIN SIO2 ON SI, Applied physics letters, 73(15), 1998, pp. 2131-2133

Authors: RICHTER CA TIEBER VL DENISON MS GIESY JP

Citation: Ca. Richter et al., AN IN-VITRO RAINBOW-TROUT CELL BIOASSAY FOR ARYL-HYDROCARBON RECEPTOR-MEDIATED TOXINS, Environmental toxicology and chemistry, 16(3), 1997, pp. 543-550

Authors: RICHTER CA SEILER DG PELLEGRINO JG

Citation: Ca. Richter et al., QUANTUM CONDUCTANCE FLUCTUATIONS IN THE LARGE-SIZE-SCALE REGIME, Physical review. B, Condensed matter, 53(19), 1996, pp. 13086-13090

Authors: DURA JA PELLEGRINO JG RICHTER CA

Citation: Ja. Dura et al., X-RAY REFLECTIVITY DETERMINATION OF INTERFACE ROUGHNESS CORRELATED WITH TRANSPORT-PROPERTIES OF (ALGA)AS GAAS HIGH-ELECTRON-MOBILITY TRANSISTOR DEVICES/, Applied physics letters, 69(8), 1996, pp. 1134-1136

Authors: PELLEGRINO JG RICHTER CA DURA JA AMIRTHARAJ PM QADRI SB ROUGHANI B

Citation: Jg. Pellegrino et al., BUFFER LAYER-MODULATION-DOPED FIELD-EFFECT-TRANSISTOR INTERACTIONS AL0.33GA0.67AS GAAS SUPERLATTICE SYSTEM/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 787-791

Authors: RICHTER CA WHEELER RG SACKS RN

Citation: Ca. Richter et al., TRANSITIONS BETWEEN EDGE AND BULK CHANNELS IN THE QUANTUM HALL REGIME, Surface science, 305(1-3), 1994, pp. 145-150