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Results: 1-12 |
Results: 12
CRYSTALLITE SIZE DISTRIBUTIONS AND LATTICE-DEFECTS IN RF-SPUTTERED NANOGRAIN TIO2 AND SNO2 FILMS
Authors: RICKERBY DG HORRILLO MC
Citation: Dg. Rickerby et Mc. Horrillo, CRYSTALLITE SIZE DISTRIBUTIONS AND LATTICE-DEFECTS IN RF-SPUTTERED NANOGRAIN TIO2 AND SNO2 FILMS, Nanostructured materials, 10(3), 1998, pp. 357-363
QUANTITATIVE EDS ANALYSIS OF SIO2 AL2O3/TIO2 MULTILAYER FILMS/
Authors: RICKERBY DG WACHTER N REICHELT R
Citation: Dg. Rickerby et al., QUANTITATIVE EDS ANALYSIS OF SIO2 AL2O3/TIO2 MULTILAYER FILMS/, Mikrochimica acta (1966), 1998, pp. 149-154
SWELLING BEHAVIOR AND TEM STUDIES OF SICF SIC COMPOSITES AFTER FUSIONRELEVANT HELIUM IMPLANTATION/
Authors: SCHOLZ HW REBELO AJF RICKERBY DG KROGUL P LEE WE EVANS JH FENICI P
Citation: Hw. Scholz et al., SWELLING BEHAVIOR AND TEM STUDIES OF SICF SIC COMPOSITES AFTER FUSIONRELEVANT HELIUM IMPLANTATION/, Journal of nuclear materials, 263, 1998, pp. 1572-1576
3RD INTERNATIONAL WORKSHOP ON METASTABLE PHASES - AMORPHOUS AND NANOCRYSTALLINE MATERIALS, THEORETICAL ASPECTS, INDUSTRIAL AND TECHNOLOGICAL TRANSFER - BOLOGNA, ITALY, 9-11 APRIL 1996 - FOREWORD
Authors: BONETTI E RICKERBY DG VALDRE G
Citation: E. Bonetti et al., 3RD INTERNATIONAL WORKSHOP ON METASTABLE PHASES - AMORPHOUS AND NANOCRYSTALLINE MATERIALS, THEORETICAL ASPECTS, INDUSTRIAL AND TECHNOLOGICAL TRANSFER - BOLOGNA, ITALY, 9-11 APRIL 1996 - FOREWORD, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 76(4), 1997, pp. 405-405
ON THE GRAIN-BOUNDARY AND DEFECT STRUCTURE OF NANOCRYSTALLINE TITANIUM-OXIDE
Authors: RICKERBY DG
Citation: Dg. Rickerby, ON THE GRAIN-BOUNDARY AND DEFECT STRUCTURE OF NANOCRYSTALLINE TITANIUM-OXIDE, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 76(4), 1997, pp. 573-583
MICROSTRUCTURAL CHARACTERIZATION OF NANOGRAIN TIN OXIDE GAS SENSORS
Authors: RICKERBY DG HORRILLO MC SANTOS JP SERRINI P
Citation: Dg. Rickerby et al., MICROSTRUCTURAL CHARACTERIZATION OF NANOGRAIN TIN OXIDE GAS SENSORS, Nanostructured materials, 9(1-8), 1997, pp. 43-52
INTERSTITIAL POSITIONS OF TIN IONS IN ALPHA-(FERICHSN)(2)O-3 SOLID-SOLUTIONS PREPARED BY MECHANICAL ALLOYING
Authors: JIANG JZ LIN R NIELSEN K MORUP S RICKERBY DG CLASEN R
Citation: Jz. Jiang et al., INTERSTITIAL POSITIONS OF TIN IONS IN ALPHA-(FERICHSN)(2)O-3 SOLID-SOLUTIONS PREPARED BY MECHANICAL ALLOYING, Physical review. B, Condensed matter, 55(22), 1997, pp. 14830-14835
MICROSTRUCTURAL EXAMINATION OF LAYERED COATINGS BY SCANNING ELECTRON-MICROSCOPY, TRANSMISSION ELECTRON-MICROSCOPY, AND ATOMIC-FORCE MICROSCOPY
Authors: RICKERBY DG FRIESEN T
Citation: Dg. Rickerby et T. Friesen, MICROSTRUCTURAL EXAMINATION OF LAYERED COATINGS BY SCANNING ELECTRON-MICROSCOPY, TRANSMISSION ELECTRON-MICROSCOPY, AND ATOMIC-FORCE MICROSCOPY, Materials characterization, 36(4-5), 1996, pp. 213-223
BARRIERS TO ENERGY-DISPERSIVE SPECTROMETRY WITH LOW-ENERGY X-RAYS
Authors: RICKERBY DG
Citation: Dg. Rickerby, BARRIERS TO ENERGY-DISPERSIVE SPECTROMETRY WITH LOW-ENERGY X-RAYS, Mikrochimica acta, 1996, pp. 493-500
PROGRESS IN THE CHARACTERIZATION OF LAYERED STRUCTURES BY X-RAY-MICROANALYSIS
Authors: RICKERBY DG
Citation: Dg. Rickerby, PROGRESS IN THE CHARACTERIZATION OF LAYERED STRUCTURES BY X-RAY-MICROANALYSIS, Microscopy microanalysis microstructures, 6(5-6), 1995, pp. 621-631
X-RAY-MICROANALYSIS OF THIN-FILM LAYERED SPECIMENS CONTAINING LIGHT-ELEMENTS
Authors: RICKERBY DG THIOT JF
Citation: Dg. Rickerby et Jf. Thiot, X-RAY-MICROANALYSIS OF THIN-FILM LAYERED SPECIMENS CONTAINING LIGHT-ELEMENTS, Mikrochimica acta, 114, 1994, pp. 421-429
MICRODIFFRACTION STUDIES OF NANOCRYSTALLINE NITRIDE FILMS
Authors: RICKERBY DG
Citation: Dg. Rickerby, MICRODIFFRACTION STUDIES OF NANOCRYSTALLINE NITRIDE FILMS, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 68(6), 1993, pp. 939-948
Risultati: 1-12 |