Authors: ROSTEN HI LASANCE CJM PARRY JD

Citation: Hi. Rosten et al., THE WORLD OF THERMAL CHARACTERIZATION ACCORDING TO DELPHI - PART I - BACKGROUND TO DELPHI, IEEE transactions on components, packaging, and manufacturing technology. Part A, 20(4), 1997, pp. 384-391

Authors: LASANCE CJM ROSTEN HI PARRY JD

Citation: Cjm. Lasance et al., THE WORLD OF THERMAL CHARACTERIZATION ACCORDING TO DELPHI - PART II -EXPERIMENTAL AND NUMERICAL-METHODS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 20(4), 1997, pp. 392-398