Authors: PIETSCH U METZGER H RUGEL S JENICHEN B ROBINSON IK

Citation: U. Pietsch et al., DEPTH-RESOLVED MEASUREMENT OF LATTICE-RELAXATION IN GA1-XINXAS GAAS STRAINED-LAYER SUPERLATTICES BY MEANS OF GRAZING-INCIDENCE X-RAY-DIFFRACTION/, Journal of applied physics, 74(4), 1993, pp. 2381-2387

Authors: RHAN H PIETSCH U RUGEL S METZGER H PEISL J

Citation: H. Rhan et al., INVESTIGATIONS OF SEMICONDUCTOR SUPERLATTICES BY DEPTH-SENSITIVE X-RAY-METHODS, Journal of applied physics, 74(1), 1993, pp. 146-152