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Citation: L. Kaplan et al., STM AND XPS STUDY OF FILTERED VACUUM-ARC DEPOSITED SN-O FILMS, Thin solid films, 291, 1996, pp. 355-361

Authors: RUSMAN I KLIBANOV L BURSTEIN L ROSENBERG Y WEINSTEIN V BENJACOB E CROITORU N SEIDMAN A

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Authors: KAPLAN L ZHITOMIRSKY VN GOLDSMITH S BOXMAN RL RUSMAN I

Citation: L. Kaplan et al., ARC BEHAVIOR DURING FILTERED VACUUM ARC DEPOSITION OF SN-O THIN-FILMS, Surface & coatings technology, 76(1-3), 1995, pp. 181-189

Authors: WEINSTEIN V GLIKMAN E SLUTZKY M RUSMAN I KELSON I BENJACOB E

Citation: V. Weinstein et al., STM DETECTION OF IMPRINTS LEFT ON GRAPHITE BY NUCLEAR-REACTION PRODUCTS, Physics letters. A, 190(5-6), 1994, pp. 473-479