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Results: 5

Authors: IONESCU AM CHOVET A POPESCU AE RUSU A STERIU D
Citation: Am. Ionescu et al., EXTRACTION METHOD FOR SOURCE SERIES RESISTANCE AND TRANSVERSE FIELD MOBILITY REDUCTION COEFFICIENT USING THE MOSFET SATURATION REGION, Microelectronics and reliability, 38(5), 1998, pp. 753-758

Authors: RUSU A RADU A NICULESCU A ALDICA G POPA S
Citation: A. Rusu et al., HTS-SQUIDS AND RELATED INSTRUMENT MODELS MADE IN ROMANIA, Sensors and actuators. A, Physical, 59(1-3), 1997, pp. 347-351

Authors: IONESCU AM CRISTOLOVEANU S WILSON SR RUSU A CHOVET A SEGHIR H
Citation: Am. Ionescu et al., IMPROVED CHARACTERIZATION OF FULLY-DEPLETED SOI WAFERS BY PSEUDO-MOS TRANSISTOR, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 228-232

Authors: IONESCU AM RUSU A CHOVET A
Citation: Am. Ionescu et al., A PHYSICAL ANALYSIS OF DRAIN CURRENT TRANSIENTS AT LOW DRAIN VOLTAGE IN THIN-FILM SOI MOSFETS, Microelectronic engineering, 28(1-4), 1995, pp. 431-434

Authors: MEREANU V CECAL A RUSU A CIUGUREANU D NICA M BADEA A
Citation: V. Mereanu et al., URANIUM-TRACES DETERMINATION BY ADSORPTIV E STRIPPING VOLTAMETRY, Revista de chimie, 46(7), 1995, pp. 682-686
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