Citation: Jm. Kim et al., PARAMETERS FOR IMPROVING RELIABILITY OF FULL-COLOR FIELD-EMISSION DISPLAY DEVICES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 736-740
Authors:
KIM JM
HONG JP
KIM JW
CHOI JH
PARK NS
KANG JH
JANG JE
RYU YS
YANG HC
Citation: Jm. Kim et al., RELIABILITY-ANALYSIS OF 4-IN FIELD-EMISSION DISPLAY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(2), 1997, pp. 528-532
Citation: Ms. Han et al., RAPID THERMAL ANNEALING EFFECTS IN CDTE(111) THIN-FILMS GROWN ON SI(100) SUBSTRATES BY MOLECULAR-BEAM EPITAXY, Thin solid films, 293(1-2), 1997, pp. 196-199
Citation: Ms. Han et al., IMPROVEMENT OF THE CRYSTALLINITY OF CDTE EPITAXIAL FILM GROWN ON SI SUBSTRATES BY MOLECULAR-BEAM EPITAXY USING THE 2-STEP GROWTH METHOD, Thin solid films, 292(1-2), 1997, pp. 232-235