Authors:
Bowallius, O
Ankarcrona, J
Hammar, M
Anand, S
Nilsson, S
Landgren, G
Radamson, H
Tilly, L
Citation: O. Bowallius et al., Scanning capacitance microscopy for two-dimensional doping profiling in Si- and InP-based device structures, PHYS SCR, T79, 1999, pp. 163-166
Authors:
Pecz, B
Yakimova, R
Syvajarvi, M
Lockowandt, C
Radamson, H
Radnoczi, G
Janzen, E
Citation: B. Pecz et al., Structural investigation of SiC epitaxial layers grown under microgravity and on-ground conditions, THIN SOL FI, 357(2), 1999, pp. 137-143