Authors:
Jaouen, M
Hug, G
Ravel, B
Ankudinov, AL
Rehr, JJ
Citation: M. Jaouen et al., Polarisation effects in hexagonal boron nitride near-edge structure: A real-space multiple scattering approach, EUROPH LETT, 49(3), 2000, pp. 343-349
Citation: Zh. Levine et B. Ravel, Identification of materials in integrated circuit interconnects using x-ray absorption near-edge spectroscopy, J APPL PHYS, 85(1), 1999, pp. 558-564