Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-25
|
26-28
|
Results: 26-28/28
Electrical characterization of electron cyclotron resonance deposited silicon nitride dual layer for enhanced Al/SiNx : H/InP metal-insulator-semiconductor structures fabrication
Authors:
Pelaez, R Castan, E Duenas, S Barbolla, J Redondo, E Martil, I Gonzalez-Diaz, G
Citation:
R. Pelaez et al., Electrical characterization of electron cyclotron resonance deposited silicon nitride dual layer for enhanced Al/SiNx : H/InP metal-insulator-semiconductor structures fabrication, J APPL PHYS, 86(12), 1999, pp. 6924-6930
Low interface trap density in rapid thermally annealed Al/SiNx : H/InP metal-insulator-semiconductor devices
Authors:
Redondo, E Blanco, N Martil, I Gonzalez-Diaz, G
Citation:
E. Redondo et al., Low interface trap density in rapid thermally annealed Al/SiNx : H/InP metal-insulator-semiconductor devices, APPL PHYS L, 74(7), 1999, pp. 991-993
Structure of the ovine pineal gland during prenatal development
Authors:
Regodon, S Franco, A Masot, J Redondo, E
Citation:
S. Regodon et al., Structure of the ovine pineal gland during prenatal development, J PINEAL R, 25(4), 1998, pp. 229-239
Risultati:
1-25
|
26-28
|