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Results: 1-3 |
Results: 3
Maximum-entropy deconvolution applied to electron energy-loss spectroscopy
Authors: Overwijk, MHF Reefman, D
Citation: Mhf. Overwijk et D. Reefman, Maximum-entropy deconvolution applied to electron energy-loss spectroscopy, MICRON, 31(4), 2000, pp. 325-331
X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: arevision and allowance for texture and non-uniform fault probabilities
Authors: Velterop, L Delhez, R de Keijser, TH Mittemeijer, EJ Reefman, D
Citation: L. Velterop et al., X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: arevision and allowance for texture and non-uniform fault probabilities, J APPL CRYS, 33, 2000, pp. 296-306
Alumina particle degradation during solid particle impact on glass
Authors: Slikkerveer, PJ Veld, HI Verspui, M de With, B Reefman, D
Citation: Pj. Slikkerveer et al., Alumina particle degradation during solid particle impact on glass, J AM CERAM, 83(9), 2000, pp. 2263-2266
Risultati: 1-3 |