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Results: 1-8 |
Results: 8
The application of white radiation to residual stress analysis in the intermediate zone between surface and volume
Authors: Genzel, C Stock, C Wallis, B Reimers, W
Citation: C. Genzel et al., The application of white radiation to residual stress analysis in the intermediate zone between surface and volume, NUCL INST A, 467, 2001, pp. 1253-1256
Residual stresses in coronary artery stents
Authors: Moller, D Reimers, W Pyzalla, A Fischer, A
Citation: D. Moller et al., Residual stresses in coronary artery stents, J BIOMED MR, 58(1), 2001, pp. 69-74
Simulation of the development of deformation textures and residual stresses using the Taylor-Bishop-Hill theory
Authors: Aris, S Pyzalla, A Reimers, W
Citation: S. Aris et al., Simulation of the development of deformation textures and residual stresses using the Taylor-Bishop-Hill theory, COMP MAT SC, 16(1-4), 1999, pp. 76-80
Analysis of residual stress states using diffraction methods
Authors: Reimers, W
Citation: W. Reimers, Analysis of residual stress states using diffraction methods, ACT PHY P A, 96(2), 1999, pp. 229-238
The use of high-energy synchrotron diffraction for residual stress analyses
Authors: Reimers, W Pyzalla, A Broda, M Brusch, G Dantz, D Schmackers, T Liss, KD Tschentscher, T
Citation: W. Reimers et al., The use of high-energy synchrotron diffraction for residual stress analyses, J MAT SCI L, 18(7), 1999, pp. 581-583
Some new aspects in X-ray stress analysis of thin layers
Authors: Genzel, C Reimers, W
Citation: C. Genzel et W. Reimers, Some new aspects in X-ray stress analysis of thin layers, SURF COAT, 119, 1999, pp. 404-409
A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials.II. Examples
Authors: Genzel, C Broda, M Dantz, D Reimers, W
Citation: C. Genzel et al., A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials.II. Examples, J APPL CRYS, 32, 1999, pp. 779-787
Evaluation of residual stresses in the bulk of materials by high energy synchrotron diffraction
Authors: Reimers, W Broda, M Brusch, G Dantz, D Liss, KD Pyzalla, A Schmackers, T Tschentscher, T
Citation: W. Reimers et al., Evaluation of residual stresses in the bulk of materials by high energy synchrotron diffraction, J NOND EVAL, 17(3), 1998, pp. 129-140
Risultati: 1-8 |