Authors: Remley, KA Williams, DF DeGroot, DC Verspecht, J Kerley, J

Citation: Ka. Remley et al., Effects of nonlinear diode junction capacitance on the nose-to-nose calibration, IEEE MICR W, 11(5), 2001, pp. 196-198

Authors: Remley, KA Anderson, HR Weisshaar, A

Citation: Ka. Remley et al., Improving the accuracy of ray-tracing techniques for indoor propagation modeling (vol 49, p 2350, 2000), IEEE VEH T, 50(1), 2001, pp. 335-335

Authors: Williams, DF Remley, KA

Citation: Df. Williams et Ka. Remley, Analytic sampling-circuit model, IEEE MICR T, 49(6), 2001, pp. 1013-1019

Authors: Remley, KA Anderson, HR Weisshar, A

Citation: Ka. Remley et al., Improving the accuracy of ray-tracing techniques for indoor propagation modeling, IEEE VEH T, 49(6), 2000, pp. 2350-2358

Authors: Remley, KA Weisshaar, A Anderson, HR

Citation: Ka. Remley et al., Improved diffraction coefficients for lossy dielectric wedges, ELECTR LETT, 35(21), 1999, pp. 1826-1827

Authors: Remley, KA Weisshaar, A Goodnick, SM Tripathi, VK

Citation: Ka. Remley et al., Characterization of near- and far-field radiation from ultrafast electronic systems, IEEE MICR T, 46(12), 1998, pp. 2476-2483