Authors: Ren, QW Nanver, LK Visser, CCG Slotboom, JW

Citation: Qw. Ren et al., Al/Si contacting of ultra-shallow epitaxially grown Si and SiGe junctions, J MAT S-M E, 12(4-6), 2001, pp. 313-316

Authors: van den Oever, LCM Nanver, LK Scholtes, TLM van Zeijl, HW van Noort, WD Ren, QW Slotboom, JW

Citation: Lcm. Van Den Oever et al., Epitaxy and device behaviour of collector-up SiGeHBTs with a partial p-type collector, SOL ST ELEC, 45(11), 2001, pp. 1899-1904

Authors: Li, S Zhuo, JS Ren, QW

Citation: S. Li et al., Parameter identification of dynamic models using a Bayes approach, APP MATH ME, 21(4), 2000, pp. 447-454

Authors: Dui, GS Ren, QW Shen, ZJ

Citation: Gs. Dui et al., Conjugate stresses to Seth's strain class, MECH RES CO, 27(5), 2000, pp. 539-542

Authors: Dui, GS Ren, QW Shen, ZJ

Citation: Gs. Dui et al., Time rates of Hill's strain tensors, J ELAST, 54(2), 1999, pp. 129-140

Authors: Dui, GS Ren, QW

Citation: Gs. Dui et Qw. Ren, Conjugate stress of strain E-(3)=1/3(U-3-I), MECH RES CO, 26(5), 1999, pp. 529-534