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Citation: Cc. Retsch et I. Mcnulty, X-ray speckle contrast variation across absorption edges - art. no. 077401, PHYS REV L, 8707(7), 2001, pp. 7401

Authors: Paterson, D Allman, BE McMahon, PJ Lin, J Moldovan, N Nugent, KA McNulty, I Chantler, CT Retsch, CC Irving, THK Mancini, DC

Citation: D. Paterson et al., Spatial coherence measurement of X-ray undulator radiation, OPT COMMUN, 195(1-4), 2001, pp. 79-84

Authors: Levine, ZH Grantham, S Neogi, S Frigo, SP McNulty, I Retsch, CC Wang, YX Lucatorto, TB

Citation: Zh. Levine et al., Accurate pattern registration for integrated circuit tomography, J APPL PHYS, 90(2), 2001, pp. 556-560

Authors: Allman, BE McMahon, PJ Tiller, JB Nugent, KA Paganin, D Barty, A McNulty, I Frigo, SP Wang, YX Retsch, CC

Citation: Be. Allman et al., Noninterferometric quantitative phase imaging with soft x rays, J OPT SOC A, 17(10), 2000, pp. 1732-1743

Authors: Levine, ZH Kalukin, AR Kuhn, M Frigo, SP McNulty, I Retsch, CC Wang, YX Arp, U Lucatorto, TB Ravel, BD Tarrio, C

Citation: Zh. Levine et al., Tomography of integrated circuit interconnect with an electromigration void, J APPL PHYS, 87(9), 2000, pp. 4483-4488

Authors: Su, X Stagarescu, C Xu, G Eastman, DE McNulty, I Frigo, SP Wang, YX Retsch, CC Noyan, IC Hu, CK

Citation: X. Su et al., Quantitative nanoscale metrology study of Cu/SiO2 interconnect technology using transmission x-ray microscopy, APPL PHYS L, 77(21), 2000, pp. 3465-3467