Authors:
Retzko, I
Friedrich, JF
Lippitz, A
Unger, WES
Citation: I. Retzko et al., Chemical analysis of plasma-polymerized films: The application of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (NEXAFS) and fourier transform infrared spectroscopy (FTIR), J ELEC SPEC, 121(1-3), 2001, pp. 111-129