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Results: 1-16 |
Results: 16
On the design of low-density parity-check codes within 0.0045 dB of the Shannon limit
Authors: Chung, SY Forney, GD Richardson, TJ Urbanke, R
Citation: Sy. Chung et al., On the design of low-density parity-check codes within 0.0045 dB of the Shannon limit, IEEE COMM L, 5(2), 2001, pp. 58-60
Non-mutual captures in cyclic pursuit
Authors: Richardson, TJ
Citation: Tj. Richardson, Non-mutual captures in cyclic pursuit, ANN MATH A, 31(1-4), 2001, pp. 127-146
Concerning the crystal structure of BrF3 center dot AuF3
Authors: Dove, MFA Benkic, P Platte, C Richardson, TJ Bartlett, N
Citation: Mfa. Dove et al., Concerning the crystal structure of BrF3 center dot AuF3, J FLUORINE, 110(2), 2001, pp. 83-86
Multiple-antenna signal constellations for fading channels
Authors: Agrawal, D Richardson, TJ Urbanke, RL
Citation: D. Agrawal et al., Multiple-antenna signal constellations for fading channels, IEEE INFO T, 47(6), 2001, pp. 2618-2626
The capacity of low-density parity-check codes under message-passing decoding
Authors: Richardson, TJ Urbanke, RL
Citation: Tj. Richardson et Rl. Urbanke, The capacity of low-density parity-check codes under message-passing decoding, IEEE INFO T, 47(2), 2001, pp. 599-618
Design of capacity-approaching irregular low-density parity-check codes
Authors: Richardson, TJ Shokrollahi, MA Urbanke, RL
Citation: Tj. Richardson et al., Design of capacity-approaching irregular low-density parity-check codes, IEEE INFO T, 47(2), 2001, pp. 619-637
Efficient encoding of low-density parity-check codes
Authors: Richardson, TJ Urbanke, RL
Citation: Tj. Richardson et Rl. Urbanke, Efficient encoding of low-density parity-check codes, IEEE INFO T, 47(2), 2001, pp. 638-656
Analysis of sum-product decoding of low-density parity-check codes using aGaussian approximation
Authors: Chung, SY Richardson, TJ Urbanke, RL
Citation: Sy. Chung et al., Analysis of sum-product decoding of low-density parity-check codes using aGaussian approximation, IEEE INFO T, 47(2), 2001, pp. 657-670
Liquid phase deposition of electrochromic thin films
Authors: Richardson, TJ Rubin, MD
Citation: Tj. Richardson et Md. Rubin, Liquid phase deposition of electrochromic thin films, ELECTR ACT, 46(13-14), 2001, pp. 2119-2123
Electrochromism is copper oxide thin films
Authors: Richardson, TJ Slack, JL Rubin, MD
Citation: Tj. Richardson et al., Electrochromism is copper oxide thin films, ELECTR ACT, 46(13-14), 2001, pp. 2281-2284
A high-rate manganese oxide for rechargeable lithium battery applications
Authors: Doeff, MM Anapolsky, A Edman, L Richardson, TJ De Jonghe, LC
Citation: Mm. Doeff et al., A high-rate manganese oxide for rechargeable lithium battery applications, J ELCHEM SO, 148(3), 2001, pp. A230-A236
Electrochemical and infrared studies of the reduction of organic carbonates
Authors: Zhang, XR Kostecki, R Richardson, TJ Pugh, JK Ross, PN
Citation: Xr. Zhang et al., Electrochemical and infrared studies of the reduction of organic carbonates, J ELCHEM SO, 148(12), 2001, pp. A1341-A1345
Switchable mirrors based on nickel-magnesium films
Authors: Richardson, TJ Slack, JL Armitage, RD Kostecki, R Farangis, B Rubin, MD
Citation: Tj. Richardson et al., Switchable mirrors based on nickel-magnesium films, APPL PHYS L, 78(20), 2001, pp. 3047-3049
Systematic design of unitary space-time constellations
Authors: Hochwald, BM Marzetta, TL Richardson, TJ Sweldens, W Urbanke, R
Citation: Bm. Hochwald et al., Systematic design of unitary space-time constellations, IEEE INFO T, 46(6), 2000, pp. 1962-1973
In situ UV-visible spectroscopy: characterization of overcharge protectionadditives for secondary lithium batteries
Authors: Richardson, TJ Ross, PN
Citation: Tj. Richardson et Pn. Ross, In situ UV-visible spectroscopy: characterization of overcharge protectionadditives for secondary lithium batteries, J POWER SOU, 84(1), 1999, pp. 1-5
Processor shadowing: Maximizing expected throughput in fault-tolerant systems
Authors: Bruno, JL Coffman, EG Lagarias, JC Richardson, TJ Shor, PW
Citation: Jl. Bruno et al., Processor shadowing: Maximizing expected throughput in fault-tolerant systems, MATH OPER R, 24(2), 1999, pp. 362-382
Risultati: 1-16 |