Authors: Krause, B Durr, AC Ritley, KA Schreiber, F Dosch, H Smilgies, D

Citation: B. Krause et al., On the coexistence of different polymorphs in organic epitaxy: alpha and beta phase of PTCDA on Ag(111), APPL SURF S, 175, 2001, pp. 332-336

Authors: Schreiber, F Ritley, KA Vartanyants, IA Dosch, H Zegenhagen, J Cowie, BCC

Citation: F. Schreiber et al., Non-dipolar contributions in XPS detection of X-ray standing waves, SURF SCI, 486(3), 2001, pp. L519-L523

Authors: Ritley, KA Krause, B Schreiber, F Dosch, H

Citation: Ka. Ritley et al., A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements, REV SCI INS, 72(2), 2001, pp. 1453-1457

Authors: Ritley, KA Schlestein, M Dosch, H

Citation: Ka. Ritley et al., DataScan: An extensible program for image analysis in Java, COMP PHYS C, 137(2), 2001, pp. 300-311

Authors: Ritley, KA Just, KP Schreiber, F Dosch, H Niesen, TP Aldinger, F

Citation: Ka. Ritley et al., X-ray reflectivity study of solution-deposited ZrO2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification, J MATER RES, 15(12), 2000, pp. 2706-2713

Authors: Ritley, KA Flynn, CP

Citation: Ka. Ritley et Cp. Flynn, The effect of strain on the magnetic properties of b-axis-oriented Dy thinfilms, J MAGN MAGN, 199, 1999, pp. 596-598