Authors:
Miranda, FA
Van Keuls, FW
Subramanyam, G
Mueller, CH
Romanofsky, RR
Rosado, G
Citation: Fa. Miranda et al., Correlation between material properties of ferroelectric thin films and design parameters for microwave device applications: Modeling examples and experimental verification, INTEGR FERR, 24(1-4), 1999, pp. 195-214