Authors:
Richter, P
Kress, M
Mohler, E
Roskos, HG
Jakob, G
Adrian, H
Citation: P. Richter et al., Optical determination of the oxygen content of YBa2Cu3O6+x thin films by IR reflectance and transmittance measurements, PHYSICA C, 366(1), 2001, pp. 63-72
Citation: Hg. Roskos, Overview on time-domain terahertz spectroscopy and its applications in atomic and semiconductor physics, PHYS SCR, T86, 2000, pp. 51-54