Authors:
Bertagna, V
Erre, R
Rouelle, F
Levy, D
Petitdidier, S
Chemla, M
Citation: V. Bertagna et al., Electrochemical impedance spectroscopy as a probe for wet chemical siliconoxide characterization, J SOL ST EL, 5(5), 2001, pp. 306-312
Citation: V. Bertagna et al., Electrochemical test for silicon surface contamination by copper traces inHF, HF plus HCl and HF+NH4F dilute solutions, SEMIC SCI T, 15(2), 2000, pp. 121-125
Citation: V. Bertagna et al., Ionic components dependence of the charge transfer reactions at the silicon/HF solution interface, J SOL ST EL, 4(1), 1999, pp. 42-51
Citation: V. Bertagna et al., Corrosion rate of n- and p-silicon substrates in HF, HF+HCl, and HF+NH4F aqueous solutions, J ELCHEM SO, 146(1), 1999, pp. 83-90