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Results: 1
Method for determining the optical constants of thin dielectric films withvariable thickness using only their shrunk reflection spectra
Authors: Ruiz-Perez, JJ Gonzalez-Leal, JM Minkov, DA Marquez, E
Citation: Jj. Ruiz-perez et al., Method for determining the optical constants of thin dielectric films withvariable thickness using only their shrunk reflection spectra, J PHYS D, 34(16), 2001, pp. 2489-2496
Risultati: 1-1 |