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Results:
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Results: 2
Silicon based affinity biochips viewed with imaging ellipsometry
Authors:
van Noort, D Rumberg, J Jager, EWH Mandenius, CF
Citation:
D. Van Noort et al., Silicon based affinity biochips viewed with imaging ellipsometry, MEAS SCI T, 11(6), 2000, pp. 801-808
Raman and RAS measurements on uniaxially strained thin semiconductor layers
Authors:
Liarokapis, E Papadimitriou, D Rumberg, J Richter, W
Citation:
E. Liarokapis et al., Raman and RAS measurements on uniaxially strained thin semiconductor layers, PHYS ST S-B, 211(1), 1999, pp. 309-316
Risultati:
1-2
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