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Results:
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Results: 1
BUILT-IN SELF-TEST OF (SI)-I-2 SWITCHED-CURRENT CIRCUITS
Authors:
SAETHER GE TOUMAZOU C TAYLOR G ECKERSALL K BELL IM
Citation:
Ge. Saether et al., BUILT-IN SELF-TEST OF (SI)-I-2 SWITCHED-CURRENT CIRCUITS, Analog integrated circuits and signal processing, 9(1), 1996, pp. 25-30
Risultati:
1-1
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