Authors:
SAKAMOTO K
FUEKI S
YAMAZAKI S
ABE T
KOBAYASHI K
NISHINO H
SATOH T
TAKEMOTO A
OOKURA A
OHNO M
SAGOH S
OAE Y
YAMADA A
KAI J
YASUDA H
Citation: K. Sakamoto et al., ELECTRON-BEAM BLOCK EXPOSURE SYSTEM FOR 256M DYNAMIC RANDOM-ACCESS MEMORY LITHOGRAPHY, JPN J A P 1, 32(12B), 1993, pp. 6006-6011