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Results:
1-7
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Results: 7
Authors:
DUCOS C
SAINTCHRISTOPHE E
FREMONT H
NKAOUA G
PELLET C
DANTO Y
Citation: C. Ducos et al., EVALUATION OF STRESSES IN PACKAGED ICS BY IN-SITU MEASUREMENTS WITH AN ASSEMBLY TEST CHIP AND SIMULATION, Microelectronics and reliability, 37(10-11), 1997, pp. 1795-1798
Authors:
SAINTCHRISTOPHE E
FREMONT H
NKAOUA G
DANTO Y
Citation: E. Saintchristophe et al., APPLICATIONS OF A THEORETICAL-MODEL FOR LINE-WIDTH CONTROL IN PHOTORESISTS SENSITIZED BY A LASER-BEAM, Electronics Letters, 33(12), 1997, pp. 1049-1051
Authors:
SAINTCHRISTOPHE E
FREMONT H
FATHI M
DANTO Y
Citation: E. Saintchristophe et al., PHOTORESIST DEVELOPMENT MODEL FOR LINEWIDTH CONTROL IN THE FABRICATION OF MCM AND CUSTOMIZED ASICS, Journal de physique. III, 6(11), 1996, pp. 1507-1526
Authors:
FLEURY A
SAINTCHRISTOPHE E
FREMONT H
FATHI M
NKAOUA G
DANTO Y
Citation: A. Fleury et al., LASER-BEAM LITHOGRAPHY FOR DIRECT PATTERNING OF INTERCONNECTIONS ON PREDIFFUSED ASICS, Journal de physique. III, 5(9), 1995, pp. 1455-1467
Authors:
SAINTCHRISTOPHE E
BARRUE R
PERRON JC
Citation: E. Saintchristophe et al., FMR STUDIES OF COBALT-BASED AMORPHOUS RIBBONS - EFFECT OF THE TEMPERATURE, Journal de physique. III, 4(7), 1994, pp. 1335-1340
Authors:
SAINTCHRISTOPHE E
SARDOS R
BARRUE R
PERRON JC
Citation: E. Saintchristophe et al., FMR STUDIES OF CO-70(FEMO)(2)MN-5(BSI)(23) AMORPHOUS RIBBONS - POLISHING EFFECT, Physica. B, Condensed matter, 202(1-2), 1994, pp. 111-117
Authors:
SAINTCHRISTOPHE E
SARDOS R
BARRUE R
Citation: E. Saintchristophe et al., X-BAND FMR MEASUREMENTS - ESTABLISHING OF RELATIONS BETWEEN THE COMPLEX PERMEABILITY AND REFLECTION FACTOR OF FERROMAGNETIC AMORPHOUS CONDUCTORS, Journal de physique. III, 3(10), 1993, pp. 2053-2058
Risultati:
1-7
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