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Results: 1
RAMAN MICROPROBE ANALYSIS OF STRAINED POLYSILICON DEPOSITED LAYERS
Authors:
TALAAT H NEGM S SCHAFFER HE ADAR F NASSIOPOULOS AG
Citation:
H. Talaat et al., RAMAN MICROPROBE ANALYSIS OF STRAINED POLYSILICON DEPOSITED LAYERS, Applied surface science, 123, 1998, pp. 742-745
Risultati:
1-1
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