Authors: WUNSTORF R FEICK H FRETWURST E LINDSTROM G LUTZ G OSIUS C RICHTER RH ROHE T ROLF A SCHLICHTHARLE P

Citation: R. Wunstorf et al., DAMAGE-INDUCED SURFACE EFFECTS IN SILICON DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 377(2-3), 1996, pp. 290-297