Authors:
PING AT
SCHMITZ AC
ADESIDA I
KHAN MA
CHEN Q
YANG JW
Citation: At. Ping et al., CHARACTERIZATION OF REACTIVE ION ETCHING-INDUCED DAMAGE TO N-GAN SURFACES USING SCHOTTKY DIODES, Journal of electronic materials, 26(3), 1997, pp. 266-271
Citation: At. Ping et al., DRY-ETCHING OF GAN USING CHEMICALLY ASSISTED ION-BEAM ETCHING WITH HCL AND H-2 CL-2/, Journal of electronic materials, 25(5), 1996, pp. 825-829
Authors:
SCHMITZ AC
PING AT
KHAN MA
CHEN Q
YANG JW
ADESIDA I
Citation: Ac. Schmitz et al., SCHOTTKY-BARRIER PROPERTIES OF VARIOUS METALS ON N-TYPE GAN, Semiconductor science and technology, 11(10), 1996, pp. 1464-1467