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Results: 1-25/29
Authors:
STENBERG T
VUORISTO P
KERANEN J
MANTYLA T
BUCHLER M
VIRTANEN S
SCHMUKI P
BOHNI H
Citation: T. Stenberg et al., CHARACTERIZATION OF RF-SPUTTERED IRON-OXIDE FILMS FOR MODELING PASSIVE FILMS, Thin solid films, 312(1-2), 1998, pp. 46-60
Authors:
SCHMUKI P
ERICKSON LE
LOCKWOOD DJ
Citation: P. Schmuki et al., LIGHT-EMITTING MICROPATTERNS OF POROUS SI CREATED AT SURFACE-DEFECTS, Physical review letters, 80(18), 1998, pp. 4060-4063
Authors:
BUCHLER M
SCHMUKI P
BOHNI H
Citation: M. Buchler et al., A LIGHT REFLECTANCE TECHNIQUE FOR THICKNESS MEASUREMENTS OF PASSIVE FILMS, Electrochimica acta, 43(5-6), 1998, pp. 635-637
Authors:
SCHMUKI P
VIRTANEN S
ISAACS HS
RYAN MP
DAVENPORT AJ
BOHNI H
STENBERG T
Citation: P. Schmuki et al., ELECTROCHEMICAL-BEHAVIOR OF CR2O3 FE2O3 ARTIFICIAL PASSIVE FILMS STUDIED BY IN-SITU XANES/, Journal of the Electrochemical Society, 145(3), 1998, pp. 791-801
Authors:
BUCHLER M
SCHMUKI P
BOHNI H
STENBERG T
MANTYLA T
Citation: M. Buchler et al., COMPARISON OF THE SEMICONDUCTIVE PROPERTIES OF SPUTTER-DEPOSITED IRON-OXIDES WITH THE PASSIVE FILM ON IRON, Journal of the Electrochemical Society, 145(2), 1998, pp. 378-385
Authors:
BUCHLER M
SCHMUKI P
BOHNI H
Citation: M. Buchler et al., IRON PASSIVITY IN BORATE BUFFER - FORMATION OF A DEPOSIT LAYER AND ITS INFLUENCE ON THE SEMICONDUCTING PROPERTIES, Journal of the Electrochemical Society, 145(2), 1998, pp. 609-614
DIRECT MICROPATTERNING OF SI AND GAAS USING ELECTROCHEMICAL DEVELOPMENT OF FOCUSED ION-BEAM IMPLANTS
Authors:
SCHMUKI P
ERICKSON LE
Citation: P. Schmuki et Le. Erickson, DIRECT MICROPATTERNING OF SI AND GAAS USING ELECTROCHEMICAL DEVELOPMENT OF FOCUSED ION-BEAM IMPLANTS, Applied physics letters, 73(18), 1998, pp. 2600-2602
Authors:
SCHMUKI P
ERICKSON LE
LOCKWOOD DJ
FRASER JW
CHAMPION G
LABBE HJ
Citation: P. Schmuki et al., FORMATION OF VISIBLE-LIGHT EMITTING POROUS GAAS MICROPATTERNS, Applied physics letters, 72(9), 1998, pp. 1039-1041
Authors:
ERICKSON LE
CHAMPION HG
FRASER JW
HUSSEY R
SCHMUKI P
PORCO C
Citation: Le. Erickson et al., PRINTING HALF-TONE PHOTOGRAPHIC IMAGES ON DIAMOND BY FOCUSED SILICON ION-IMPLANTATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2358-2361
Authors:
VIRTANEN S
SCHMUKI P
BUCHLER M
BOHNI H
Citation: S. Virtanen et al., STABILITY OF ARTIFICIAL AND NATURAL PASSIVE FILMS, Analusis, 25(5), 1997, pp. 21-22
Authors:
BUCHLER M
SCHMUKI P
BOHNI H
Citation: M. Buchler et al., FORMATION AND DISSOLUTION OF THE PASSIVE FILM ON IRON STUDIED BY A LIGHT REFLECTANCE TECHNIQUE, Journal of the Electrochemical Society, 144(7), 1997, pp. 2307-2312
Authors:
VIRTANEN S
SCHMUKI P
DAVENPORT AJ
VITUS CM
Citation: S. Virtanen et al., DISSOLUTION OF THIN IRON-OXIDE FILMS USED AS MODELS FOR IRON PASSIVE FILMS STUDIED BY IN-SITU X-RAY-ABSORPTION NEAR-EDGE SPECTROSCOPY, Journal of the Electrochemical Society, 144(1), 1997, pp. 198-204
Authors:
VIRTANEN S
IVES MB
SPROULE GI
SCHMUKI P
GRAHAM MJ
Citation: S. Virtanen et al., A SURFACE ANALYTICAL AND ELECTROCHEMICAL STUDY ON THE ROLE OF CERIUM IN THE CHEMICAL SURFACE-TREATMENT OF STAINLESS-STEELS, Corrosion science, 39(10-11), 1997, pp. 1897-1913
Authors:
SCHMUKI P
ERICKSON LE
CHAMPION G
MASON BF
FRASER J
MOESSNER C
Citation: P. Schmuki et al., SURFACE-TOPOLOGY OF GAAS(100) AFTER FOCUSED ION-BEAM IMPLANTATION OF SI++, Applied physics letters, 70(10), 1997, pp. 1305-1307
Authors:
SCHMUKI P
SPROULE GI
BARDWELL JA
LU ZH
GRAHAM MJ
Citation: P. Schmuki et al., THIN ANODIC OXIDES FORMED ON GAAS IN AQUEOUS-SOLUTIONS, Journal of applied physics, 79(9), 1996, pp. 7303-7311
Authors:
BARDWELL JA
DRAPER N
SCHMUKI P
Citation: Ja. Bardwell et al., GROWTH AND CHARACTERIZATION OF ANODIC OXIDES ON SI(100) FORMED IN 0.1M HYDROCHLORIC-ACID, Journal of applied physics, 79(11), 1996, pp. 8761-8769
Authors:
SCHMUKI P
VIRTANEN S
DAVENPORT AJ
VITUS CM
Citation: P. Schmuki et al., IN-SITU X-RAY-ABSORPTION NEAR-EDGE SPECTROSCOPIC STUDY OF THE CATHODIC REDUCTION OF ARTIFICIAL IRON-OXIDE PASSIVE FILMS, Journal of the Electrochemical Society, 143(2), 1996, pp. 574-582
Authors:
SCHMUKI P
VIRTANEN S
DAVENPORT AJ
VITUS CM
Citation: P. Schmuki et al., TRANSPASSIVE DISSOLUTION OF CR AND SPUTTER-DEPOSITED CR OXIDES STUDIED BY IN-SITU X-RAY NEAR-EDGE SPECTROSCOPY, Journal of the Electrochemical Society, 143(12), 1996, pp. 3997-4005
Authors:
SCHMUKI P
FRASER J
VITUS CM
GRAHAM MJ
ISAACS HS
Citation: P. Schmuki et al., INITIATION AND FORMATION OF POROUS GAAS, Journal of the Electrochemical Society, 143(10), 1996, pp. 3316-3322
Authors:
SCHMUKI P
LOCKWOOD DJ
LABBE HJ
FRASER JW
Citation: P. Schmuki et al., VISIBLE PHOTOLUMINESCENCE FROM POROUS GAAS, Applied physics letters, 69(11), 1996, pp. 1620-1622
Authors:
SCHMUKI P
BUCHANAN M
MASON BF
SPROULE GI
GRAHAM MJ
Citation: P. Schmuki et al., THICKNESS MEASUREMENTS OF THIN ANODIC OXIDES ON GAAS USING ATOMIC-FORCE MICROSCOPY, PROFILOMETRY, AND SECONDARY-ION MASS-SPECTROMETRY, Applied physics letters, 68(19), 1996, pp. 2675-2677
Authors:
SCHMUKI P
BOHNI H
Citation: P. Schmuki et H. Bohni, ILLUMINATION EFFECTS ON THE STABILITY OF THE PASSIVE FILM ON IRON, Electrochimica acta, 40(6), 1995, pp. 775-783
Authors:
VIRTANEN S
SCHMUKI P
BOHNI H
VUORISTO P
MANTYLA T
Citation: S. Virtanen et al., ARTIFICIAL CR-OXIDE AND FE-OXIDE PASSIVE LAYERS PREPARED BY SPUTTER-DEPOSITION, Journal of the Electrochemical Society, 142(9), 1995, pp. 3067-3072
Authors:
SCHMUKI P
BOHNI H
BARDWELL JA
Citation: P. Schmuki et al., IN-SITU CHARACTERIZATION OF ANODIC SILICON-OXIDE FILMS BY AC-IMPEDANCE MEASUREMENTS, Journal of the Electrochemical Society, 142(5), 1995, pp. 1705-1712
Authors:
BARDWELL JA
SCHMUKI P
SPROULE GI
LANDHEER D
MITCHELL DF
Citation: Ja. Bardwell et al., PHYSICAL AND ELECTRICAL CHARACTERIZATION OF THIN ANODIC OXIDES ON SI(100), Journal of the Electrochemical Society, 142(11), 1995, pp. 3933-3940