Authors:
SCHONECKER A
EIKELBOOM JA
BURGERS AR
LOLGEN P
LEGUIJT C
SINKE WC
Citation: A. Schonecker et al., SENSITIVITY ANALYSIS FOR THE DETERMINATION OF RECOMBINATION PARAMETERS IN SI WAFERS USING HARMONIC CARRIER GENERATION, Journal of applied physics, 79(3), 1996, pp. 1497-1504