Authors: HEMMES K HAMSTRA MA KOOPS KR WIND MM SCHRAM T DELAET J BENDER H

Citation: K. Hemmes et al., EVALUATION OF INTERFEROMETRIC ELLIPSOMETER SYSTEMS WITH A TIME RESOLUTION OF ONE MICROSECOND AND FASTER, Thin solid films, 313, 1998, pp. 40-46

Authors: SCHRAM T DELAET J TERRYN H

Citation: T. Schram et al., NONDESTRUCTIVE OPTICAL CHARACTERIZATION OF CHROMIUM CONVERSION LAYERSON ALUMINUM, Thin solid films, 313, 1998, pp. 727-731

Authors: SCHRAM T DELAET J TERRYN H

Citation: T. Schram et al., NONDESTRUCTIVE OPTICAL CHARACTERIZATION OF CHEMICAL CONVERSION COATINGS ON ALUMINUM, Journal of the Electrochemical Society, 145(8), 1998, pp. 2733-2739

Authors: SCHRAM T GOEMINNE G TERRYN H VANHOOLST W VANESPEN P

Citation: T. Schram et al., STUDY OF THE COMPOSITION OF ZIRCONIUM-BASED CHROMIUM FREE CONVERSION LAYERS ON ALUMINUM, Transactions of the Institute of Metal Finishing, 73, 1995, pp. 91-95

Authors: SCHRAM T

Citation: T. Schram, THE PSYCHOANALYTIC-STUDY OF SOCIETY, VOL 17, ESSAYS IN HONOR OF SPINDLER,GEORGE,D. AND SPINDLER,LOUISE,S. - BOYER,LB, BOYER,R, Anthropology & education quarterly, 25(4), 1994, pp. 463-472

Authors: SCHRAM T

Citation: T. Schram, ADOLESCENT LIFE AND ETHOS - AN ETHNOGRAPHY OF A UNITED-STATES HIGH-SCHOOL - CHANG,HW, Educational policy, 7(2), 1993, pp. 229-230