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Results: 1-6 |
Results: 6

Authors: SCHUERLEIN TJ SCHMIDT A LEE PA NEBESNY KW ARMSTRONG NR
Citation: Tj. Schuerlein et al., LARGE MOLECULE EPITAXY ON SINGLE-CRYSTAL METALS, INSULATORS AND SINGLE-CRYSTAL AND MBE-GROWN LAYERED SEMICONDUCTORS, JPN J A P 1, 34(7B), 1995, pp. 3837-3845

Authors: SCHMIDT A SCHUERLEIN TJ COLLINS GE ARMSTRONG NR
Citation: A. Schmidt et al., ORDERED ULTRATHIN FILMS OF PERYLENETETRACARBOXYLIC DIANHYDRIDE (PTCDA) AND DIMETHYLPERYLENEBIS(DICARBOXIMIDE) (ME-PTCDI) ON CU(100) - CHARACTERIZATION OF STRUCTURE AND SURFACE STOICHIOMETRY BY LEED, TDMS, AND XPS, Journal of physical chemistry, 99(30), 1995, pp. 11770-11779

Authors: CHAU LK CHEN SY ARMSTRONG NR COLLINS GE ENGLAND CD WILLIAMS VS ANDERSON ML SCHUERLEIN TJ LEE PA NEBESNY KW PARKINSON BA
Citation: Lk. Chau et al., ORGANIC-INORGANIC MOLECULAR-BEAM EPITAXY (O I-MBE) - FORMATION AND CHARACTERIZATION OF ORDERED PHTHALOCYANINE THIN-FILMS - PHOTOELECTROCHEMICAL PROCESSES/, Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals, 252, 1994, pp. 67-77

Authors: ENGLAND CD COLLINS GE SCHUERLEIN TJ ARMSTRONG NR
Citation: Cd. England et al., EPITAXIAL THIN-FILMS OF LARGE ORGANIC-MOLECULES - CHARACTERIZATION OFPHTHALOCYANINE AND CORONENE OVERLAYERS ON THE LAYERED SEMICONDUCTORS MOS2 AND SNS2, Langmuir, 10(8), 1994, pp. 2748-2756

Authors: SCHUERLEIN TJ ARMSTRONG NR
Citation: Tj. Schuerlein et Nr. Armstrong, FORMATION AND CHARACTERIZATION OF EPITAXIAL PHTHALOCYANINE AND PERYLENE MONOLAYERS AND BILAYERS ON CU(100) - LOW-ENERGY-ELECTRON DIFFRACTION AND THERMAL-DESORPTION MASS-SPECTROMETRY STUDIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1992-1997

Authors: ANDERSON ML WILLIAMS VS SCHUERLEIN TJ COLLINS GE ENGLAND CD CHAU LK LEE PA NEBESNY KW ARMSTRONG NR
Citation: Ml. Anderson et al., RHEED AND OPTICAL CHARACTERIZATION OF ORDERED MULTILAYERS OF PHTHALOCYANINE C60 AND PHTHALOCYANINE PERYLENE-TETRACARBOXYLICDIANHYDRIDE (PTCDA), Surface science, 309, 1994, pp. 551-558
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