Authors: TEDDER LL RUBLOFF GW SHAREEF I ANDERLE M KIM DH PARSONS GN

Citation: Ll. Tedder et al., REAL-TIME PROCESS AND PRODUCT DIAGNOSTICS IN RAPID THERMAL CHEMICAL-VAPOR-DEPOSITION USING IN-SITU MASS-SPECTROMETRIC SAMPLING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1924-1927

Authors: SHAREEF I

Citation: I. Shareef, MACHINABILITY COMPARISON OF CASTING METHODS, Journal of materials processing technology, 52(1), 1995, pp. 174-191