Authors: AFANASEV SM IMAMOV RM MAKAROV SY NOVIKOV DV SMENOV NI SHCHELOKOV AN

Citation: Sm. Afanasev et al., SINGLE-CRYSTAL X-RAY DIFFRACTOMETER FOR TESTING OF THE STRUCTURE OF SUBMICRON SURFACE-LAYERS OF SINGLE-CRYSTALS, Industrial laboratory, 59(5), 1993, pp. 483-487

Authors: AFANASEV SM GASANOV AA GULIDOV DN LEVCHENKO VM SHCHELOKOV AN

Citation: Sm. Afanasev et al., AN EXPRESS METHOD OF MEASURING THE BENDING OF ATOMIC PLANES OF SINGLE-CRYSTAL SHEETS, Industrial laboratory, 59(2), 1993, pp. 166-169