Authors: TORRES CMS SMART AP WATT M FOAD MA TSUTSUI K WILKINSON CDW

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Authors: FOAD MA WATT M SMART AP TORRES CMS WILKINSON CDW KUHN W WAGNER HP BAUER S LEIDERER H GEBHARDT W

Citation: Ma. Foad et al., HIGH-RESOLUTION DRY ETCHING OF ZINC TELLURIDE - CHARACTERIZATION OF ETCHED SURFACES BY X-RAY PHOTOELECTRON-SPECTROSCOPY, PHOTOLUMINESCENCE AND RAMAN-SCATTERING, Semiconductor science and technology, 6(9A), 1991, pp. 115-122