Authors: SMOLSKII OV DENISOV DV MAMUTIN VV

Citation: Ov. Smolskii et al., STUDY OF THE FORMATION PROCESS OF SI CEO2 STRUCTURE BOUNDARY BY THE X-RAY PHOTOELECTRON-SPECTROSCOPY/, Pis'ma v Zurnal tehniceskoj fiziki, 22(3), 1996, pp. 23-28

Authors: SMOLSKII OV MAMUTIN VV KARTENKO NF DENISOV DV KOPEV PS MELEKH BT

Citation: Ov. Smolskii et al., CHARACTERISTICS OF EPITAXIAL-GROWTH OF CE O2 FILMS ON SILICON SUBSTRATES, Pis'ma v Zurnal tehniceskoj fiziki, 22(1), 1996, pp. 68-73

Authors: TIMOFEEV FN SMOLSKII OV SHMAEV AL KULAGINA MM

Citation: Fn. Timofeev et al., REACTIVE IONIC ETCHING OF HTSC FILMS, Pis'ma v Zurnal tehniceskoj fiziki, 20(9), 1994, pp. 16-22

Authors: GAEVSKII ME DEMIDOV DM DENISOV DV KONNIKOV SG KULAGINA MM SMOLSKII OV CHALYI VP

Citation: Me. Gaevskii et al., STUDY MESA-STRUCTURES WITH HTSC LAYER OF YBA2CU3O7-X, Pis'ma v Zurnal tehniceskoj fiziki, 20(1), 1994, pp. 44-48