Authors: SOLTZ D DEPAOLI MA CESCATO L

Citation: D. Soltz et al., FRINGE STABILIZATION AND DEPTH MONITORING DURING THE HOLOGRAPHIC PHOTOELECTROCHEMICAL ETCHING OF N-INP(100) SUBSTRATES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1784-1790

Authors: SOLTZ D CESCATO L

Citation: D. Soltz et L. Cescato, POTENTIAL-INDUCED CHANGES IN THE SURFACE-MORPHOLOGY OF (100)N-INP SAMPLES PHOTOELECTROCHEMICALLY ETCHED, Journal of the Electrochemical Society, 143(9), 1996, pp. 2815-2821

Authors: FERREIRA NG SOLTZ D DECKER F CESCATO L

Citation: Ng. Ferreira et al., EVOLUTION OF SURFACE TEXTURES ON N-INP SAMPLES ETCHED PHOTOELECTROCHEMICALLY (VOL 142, PG 1348, 1995), Journal of the Electrochemical Society, 142(9), 1995, pp. 91-91

Authors: FERREIRA NG SOLTZ D DECKER F CESCATO L

Citation: Ng. Ferreira et al., EVOLUTION OF SURFACE TEXTURES ON N-INP SAMPLES ETCHED PHOTOELECTROCHEMICALLY, Journal of the Electrochemical Society, 142(4), 1995, pp. 1348-1352