Authors:
MATTHES TW
SOMMERHALTER C
RETTENBERGER A
BRUKER P
BONEBERG J
LUXSTEINER MC
LEIDERER P
Citation: Tw. Matthes et al., IMAGING OF DOPANTS IN SURFACE AND SUBSURFACE LAYERS OF THE TRANSITION-METAL DICHALCOGENIDES WS2 AND WSE2 BY SCANNING-TUNNELING-MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 1007-1011
Authors:
MATTHES TW
SOMMERHALTER C
RETTENBERGER A
BOHMISCH M
BONEBERG J
LUXSTEINER MC
LEIDERER P
Citation: Tw. Matthes et al., INVESTIGATION OF PHOTOINDUCED TUNNELING CURRENT AND LOCAL SURFACE PHOTOVOLTAGE BY STM, Applied surface science, 123, 1998, pp. 187-191
Authors:
SOMMERHALTER C
MATTHES TW
BONEBERG J
LEIDERER P
LUXSTEINER MC
Citation: C. Sommerhalter et al., TUNNELING SPECTROSCOPY ON SEMICONDUCTORS WITH A LOW SURFACE-STATE DENSITY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 1876-1883
Authors:
AKARI S
MATTHES TW
SOMMERHALTER C
BONEBERG J
LEIDERER P
Citation: S. Akari et al., QUALITATIVE CHANGE OF THE ELECTRONIC-PROPERTIES OF A SEMICONDUCTOR SURFACE BY CHEMICAL TREATMENT USING POLYELECTROLYTES, Langmuir, 13(16), 1997, pp. 4369-4371