Authors: NI WX BIRCH J TANG YS JOELSSON KB SOTOMAYORTORRES C KVICK A HANSSON GV

Citation: Wx. Ni et al., LATTICE DISTORTION IN DRY-ETCHED SI SIGE QUANTUM-DOT ARRAY STUDIED BY2D RECIPROCAL SPACE MAPPING USING SYNCHROTRON X-RAY-DIFFRACTION/, Thin solid films, 294(1-2), 1997, pp. 300-303