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Results: 1-7 |
Results: 7
XPS STUDIES ON THE OXIDATION BEHAVIOR OF SIC PARTICLES
Authors: SREEMANY M GHOSH TB PAI BC CHAKRABORTY M
Citation: M. Sreemany et al., XPS STUDIES ON THE OXIDATION BEHAVIOR OF SIC PARTICLES, Materials research bulletin, 33(2), 1998, pp. 189-198
INTERFACE PROPERTIES OF THIN OXIDE LAYERS GROWN ON STRAINED SIGE LAYERS AT LOW-TEMPERATURES
Authors: MUKHOPADHYAY M RAY SK GHOSH TB SREEMANY M MAITI CK
Citation: M. Mukhopadhyay et al., INTERFACE PROPERTIES OF THIN OXIDE LAYERS GROWN ON STRAINED SIGE LAYERS AT LOW-TEMPERATURES, Semiconductor science and technology, 11(3), 1996, pp. 360-365
APPLICATION OF RACHINGER METHOD TO SEPARATE OVERLAPPED DOUBLETS IN THE X-RAY PHOTOELECTRON-SPECTRUM
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, APPLICATION OF RACHINGER METHOD TO SEPARATE OVERLAPPED DOUBLETS IN THE X-RAY PHOTOELECTRON-SPECTRUM, Thin solid films, 280(1-2), 1996, pp. 167-170
ANGLE-RESOLVED XPS STUDY OF INHOMOGENEOUS SPECIMENS OF POLYCRYSTALLINE SILVER COVERED WITH UNIFORM GRAPHITE OVERLAYERS
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, ANGLE-RESOLVED XPS STUDY OF INHOMOGENEOUS SPECIMENS OF POLYCRYSTALLINE SILVER COVERED WITH UNIFORM GRAPHITE OVERLAYERS, Applied surface science, 90(2), 1995, pp. 241-250
ON THE XPS PEAK SHAPE-ANALYSIS
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, ON THE XPS PEAK SHAPE-ANALYSIS, Applied surface science, 81(3), 1994, pp. 365-375
ON THE XPS PEAK SHAPE-ANALYSIS
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, ON THE XPS PEAK SHAPE-ANALYSIS, Applied surface science, 81(3), 1994, pp. 365-375
ON THE CARBON 1S PHOTOELECTRON-SPECTRUM OF CELLULOSE
Authors: GHOSH TB SREEMANY M
Citation: Tb. Ghosh et M. Sreemany, ON THE CARBON 1S PHOTOELECTRON-SPECTRUM OF CELLULOSE, Indian Journal of Pure & Applied Physics, 31(12), 1993, pp. 931-935
Risultati: 1-7 |