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Results: 3
DEFECT CHARACTERIZATION OF A-SIC-H AND A-SIN-H ALLOYS PRODUCED BY ULTRAHIGH-VACUUM PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION IN DIFFERENT PLASMA CONDITIONS
Authors: STAPINSKI T AMBROSONE G COSCIA U GIORGIS F PIRRI CF
Citation: T. Stapinski et al., DEFECT CHARACTERIZATION OF A-SIC-H AND A-SIN-H ALLOYS PRODUCED BY ULTRAHIGH-VACUUM PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION IN DIFFERENT PLASMA CONDITIONS, Physica. B, Condensed matter, 254(1-2), 1998, pp. 99-106
DENSITY OF GAP STATES DECONVOLUTED FROM PHOTOCONDUCTIVE SPECTRA FOR UNDOPED AMORPHOUS-SILICON AND SILICON-CARBON THIN-FILMS
Authors: PISARKIEWICZ T STAPINSKI T ADRIAENSSENS G LAUWERENS W RAVA P
Citation: T. Pisarkiewicz et al., DENSITY OF GAP STATES DECONVOLUTED FROM PHOTOCONDUCTIVE SPECTRA FOR UNDOPED AMORPHOUS-SILICON AND SILICON-CARBON THIN-FILMS, Acta Physica Polonica. A, 87(2), 1995, pp. 407-410
STRUCTURAL AND OPTOELECTRONIC PROPERTIES OF DOPED MICROCRYSTALLINE SILICON-CARBIDE FILMS
Authors: DEMICHELIS F CROVINI G PIRRI CF TRESSO E FANCIULLI M PIESARKIEWICZ T STAPINSKI T
Citation: F. Demichelis et al., STRUCTURAL AND OPTOELECTRONIC PROPERTIES OF DOPED MICROCRYSTALLINE SILICON-CARBIDE FILMS, Semiconductor science and technology, 9(8), 1994, pp. 1543-1548
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