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Results: 1-10 |
Results: 10
SPECTROSCOPY OF BAND-TO-BAND OPTICAL-TRANSITIONS IN SI-GE ALLOYS AND SUPERLATTICES
Authors: PEARSALL TP COLACE L DIVERGILIO A JAGER W STENKAMP D THEODOROU G PRESTING H KASPER E THONKE K
Citation: Tp. Pearsall et al., SPECTROSCOPY OF BAND-TO-BAND OPTICAL-TRANSITIONS IN SI-GE ALLOYS AND SUPERLATTICES, Physical review. B, Condensed matter, 57(15), 1998, pp. 9128-9140
DETECTION AND QUANTITATIVE ASSESSMENT OF IMAGE ABERRATIONS FROM SINGLE HRTEM LATTICE IMAGES
Authors: STENKAMP D
Citation: D. Stenkamp, DETECTION AND QUANTITATIVE ASSESSMENT OF IMAGE ABERRATIONS FROM SINGLE HRTEM LATTICE IMAGES, Journal of Microscopy, 190, 1998, pp. 194-203
TEMPERATURE-DEPENDENCE OF MOBILITY IN N-TYPE SHORT-PERIOD SI-GE SUPERLATTICES
Authors: PEARSALL TP DIVERGILIO A GASSOT P MAUDE D PRESTING H KASPER E JAGER W STENKAMP D
Citation: Tp. Pearsall et al., TEMPERATURE-DEPENDENCE OF MOBILITY IN N-TYPE SHORT-PERIOD SI-GE SUPERLATTICES, Applied physics letters, 72(1), 1998, pp. 76-78
ASSESSMENT OF IMAGING PARAMETERS FROM SINGLE HRTEM LATTICE IMAGES - AQUANTITATIVE APPROACH
Authors: STENKAMP D STRUNK HP
Citation: D. Stenkamp et Hp. Strunk, ASSESSMENT OF IMAGING PARAMETERS FROM SINGLE HRTEM LATTICE IMAGES - AQUANTITATIVE APPROACH, European journal of cell biology, 74, 1997, pp. 18-18
CRYSTALLOGRAPHIC PHASE DETERMINATION OF C UINSE2 BY CONVERGENT ELECTRON-DIFFRACTION
Authors: LEICHT M STENKAMP D STRUNK HP
Citation: M. Leicht et al., CRYSTALLOGRAPHIC PHASE DETERMINATION OF C UINSE2 BY CONVERGENT ELECTRON-DIFFRACTION, European journal of cell biology, 74, 1997, pp. 44-44
MICROSTRUCTURE EVOLUTION AND NON-DIAMOND CARBON INCORPORATION IN CVD DIAMOND THIN-FILMS GROWN AT LOW SUBSTRATE TEMPERATURES
Authors: MICHLER J STIEGLER J VONKAENEL Y MOECKLI P DORSCH W STENKAMP D BLANK E
Citation: J. Michler et al., MICROSTRUCTURE EVOLUTION AND NON-DIAMOND CARBON INCORPORATION IN CVD DIAMOND THIN-FILMS GROWN AT LOW SUBSTRATE TEMPERATURES, Journal of crystal growth, 172(3-4), 1997, pp. 404-415
QUANTITATIVE-DETERMINATION OF DEFOCUS, THICKNESS AND COMPOSITION FROMHIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY LATTICE IMAGES
Authors: STENKAMP D STRUNK HP
Citation: D. Stenkamp et Hp. Strunk, QUANTITATIVE-DETERMINATION OF DEFOCUS, THICKNESS AND COMPOSITION FROMHIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY LATTICE IMAGES, Applied physics A: Materials science & processing, 62(4), 1996, pp. 369-372
AN ENANTIOSELECTIVE SYNTHESIS OF T-BUTOXYCARBAMOYL-1-METHOXYCARBONYL-2-CYCLOPENTENE - A USEFUL, GENERAL BUILDING-BLOCK
Authors: TROST BM STENKAMP D PULLEY SR
Citation: Bm. Trost et al., AN ENANTIOSELECTIVE SYNTHESIS OF T-BUTOXYCARBAMOYL-1-METHOXYCARBONYL-2-CYCLOPENTENE - A USEFUL, GENERAL BUILDING-BLOCK, Chemistry, 1(8), 1995, pp. 568-572
COMPOSITIONAL AND STRUCTURAL CHARACTERIZATION OF STRAINED SI SIXGE1-XMULTILAYERS AND INTERFACES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY/
Authors: STENKAMP D JAGER W
Citation: D. Stenkamp et W. Jager, COMPOSITIONAL AND STRUCTURAL CHARACTERIZATION OF STRAINED SI SIXGE1-XMULTILAYERS AND INTERFACES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY/, Applied physics. A, Solids and surfaces, 57(5), 1993, pp. 407-414
COMPOSITIONAL AND STRUCTURAL CHARACTERIZATION OF SIXGE1-X ALLOYS AND HETEROSTRUCTURES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
Authors: STENKAMP D JAGER W
Citation: D. Stenkamp et W. Jager, COMPOSITIONAL AND STRUCTURAL CHARACTERIZATION OF SIXGE1-X ALLOYS AND HETEROSTRUCTURES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Ultramicroscopy, 50(3), 1993, pp. 321-354
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