Authors: Pacheco, FJ Araujo, D Molina, SI Garcia, R Sacedon, A Gonzalez-Sanz, F Calleja, E Kidd, P Lourenco, MA

Citation: Fj. Pacheco et al., Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs, MATER SCI T, 14(12), 1998, pp. 1273-1278