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Results:
1-15
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Results: 15
Authors:
Yamada, K
Saiki, A
Sakaue, H
Shingubara, S
Takahagi, T
Citation: K. Yamada et al., Study of a dielectric constant due to electronic polarization using a semiempirical molecular orbital method I, JPN J A P 1, 40(8), 2001, pp. 4829-4836
Authors:
Akashi, T
Mizuno, Y
Nanko, M
Maruyama, T
Saiki, A
Tsukui, K
Tanabe, J
Citation: T. Akashi et al., Determination of diffusion coefficient of Nd3+ in NdCrO3 based on solid state reaction, MATER TRANS, 42(7), 2001, pp. 1411-1416
Authors:
Saito, K
Ishikawa, K
Saiki, A
Yamaji, I
Akai, T
Funakubo, H
Citation: K. Saito et al., Residual strain analysis of epitaxial grown SBT thin films prepared by MOCVD, INTEGR FERR, 33(1-4), 2001, pp. 59-69
Authors:
Watanabe, T
Saiki, A
Saito, K
Funakubo, H
Citation: T. Watanabe et al., Film thickness dependence of ferroelectric properties of c-axis-oriented epitaxial Bi4Ti3O12 thin films prepared by metalorganic chemical vapor deposition, J APPL PHYS, 89(7), 2001, pp. 3934-3938
Authors:
Ishikawa, K
Saiki, A
Funakubo, H
Citation: K. Ishikawa et al., Growth of epitaxial SrBi2Ta2O9 thin films by metalorganic chemical vapor deposition, JPN J A P 1, 39(4B), 2000, pp. 2102-2109
Authors:
Uchida, H
Saiki, A
Wakiya, N
Shinozaki, K
Mizutani, N
Citation: H. Uchida et al., Effect of the residual stress induced by external stress application on dielectric properties of epitaxial lead titanate film, J CERAM S J, 108(1), 2000, pp. 21-25
Authors:
Zhang, ZH
Miyatake, SI
Saiki, A
Asahi, M
Yukawa, H
Toda, H
Kikuchi, H
Yoshimura, SI
Hashimoto, N
Citation: Zh. Zhang et al., Selenium and glutathione peroxidase mRNA in rat glioma, BIOL TR EL, 73(1), 2000, pp. 67-76
Authors:
Chen, CH
Saiki, A
Wakiya, N
Shinozaki, K
Mizutani, N
Citation: Ch. Chen et al., Influence of ultra-thin YSZ layer on heteroepitaxial CeO2/YSZ/Si(001) films analyzed by X-ray reciprocal space map, J CRYST GR, 219(3), 2000, pp. 253-262
Authors:
Saiki, A
Funakubo, H
Mizutani, N
Shinozaki, K
Bak, T
Nowotny, J
Rekas, M
Sorrel, CC
Citation: A. Saiki et al., Charge transfer between oxygen and zirconia, J THERM ANA, 57(3), 1999, pp. 875-881
Authors:
Wakiya, N
Wang, JK
Saiki, A
Shinozaki, K
Mizutani, N
Citation: N. Wakiya et al., Synthesis and dielectric properties of Ba1-xR2x/3Nb2O6 (R : rare earth) with tetragonal tungsten bronze structure, J EUR CERAM, 19(6-7), 1999, pp. 1071-1075
Authors:
Uchida, H
Kiguchi, T
Saiki, A
Wakiya, N
Ishizawa, N
Shinozaki, K
Mizutani, N
Citation: H. Uchida et al., Measurement technique for the evaluation of residual stress in epitaxial thin film by asymmetric X-ray diffraction, J CERAM S J, 107(7), 1999, pp. 606-610
Authors:
Tatami, J
Saiki, A
Yasuda, K
Matsuo, Y
Citation: J. Tatami et al., Identification of dislocations on fracture surface of single crystal alumina by X-ray topography, J CERAM S J, 107(11), 1999, pp. 1063-1066
Authors:
Kiguchi, T
Saiki, A
Shinozaki, K
Mizutani, N
Citation: T. Kiguchi et al., Effect of the species of substituted ion on ferroelastic domain switching of rare-earth ion-doped ZrO2 pseudo-single crystals, J MATER RES, 14(1), 1999, pp. 142-145
Authors:
Ishizawa, N
Saiki, A
Ohdan, K
Ai, M
Citation: N. Ishizawa et al., Synthesis and powder X-ray diffraction data of a new iron phosphate Fe(PO4)center dot 0.5H(2)O, POWDER DIFF, 13(4), 1998, pp. 246-248
Authors:
Funakubo, H
Takeshima, Y
Nagano, D
Saiki, A
Shinozaki, K
Mizutani, N
Citation: H. Funakubo et al., Deposition conditions of SrTiO3 films on various substrates by CVD and their dielectric properties, THIN SOL FI, 334(1-2), 1998, pp. 71-76
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