Authors: Switkes, M Rothschild, M Salvermoser, M

Citation: M. Switkes et al., Imaging of 1-nm-thick films with 193-nm microscopy, OPTICS LETT, 26(15), 2001, pp. 1182-1184

Authors: Tomizawa, H Salvermoser, M Wieser, J Ulrich, A

Citation: H. Tomizawa et al., Influence of water vapour impurities on the atomic Xe laser, J PHYS B, 33(2), 2000, pp. 181-190

Authors: Wieser, J Ulrich, A Fedenev, A Salvermoser, M

Citation: J. Wieser et al., Novel pathways to the assignment of the third rare gas excimer continua, OPT COMMUN, 173(1-6), 2000, pp. 233-245

Authors: Salvermoser, M Murnick, DE Wieser, J Ulrich, A

Citation: M. Salvermoser et al., Energy flow and excimer yields in continuous wave rare gas-halogen systems, J APPL PHYS, 88(1), 2000, pp. 453-459

Authors: Ulrich, A Niessl, C Wieser, J Tomizawa, H Murnick, DE Salvermoser, M

Citation: A. Ulrich et al., Lasers in dense gases pumped by low-energy electron beams, J APPL PHYS, 86(7), 1999, pp. 3525-3529