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Results:
1-10
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Results: 10
Authors:
Castle, JE
Salvi, AM
Citation: Je. Castle et Am. Salvi, Interpretation of the Shirley background in x-ray photoelectron spectroscopy analysis, J VAC SCI A, 19(4), 2001, pp. 1170-1175
Authors:
Castle, JE
Salvi, AM
Citation: Je. Castle et Am. Salvi, Chemical state information from the near-peak region of the X-ray photoelectron background, J ELEC SPEC, 114, 2001, pp. 1103-1113
Authors:
Castle, JE
Salvi, AM
Guascito, MR
Citation: Je. Castle et al., Analysis of the x-ray photoelectron energy-loss background in silicides, SURF INT AN, 31(9), 2001, pp. 881-889
Authors:
Salvi, AM
Decker, F
Varsano, F
Speranza, G
Citation: Am. Salvi et al., Use of XPS for the study of cerium-vanadium (electrochromic) mixed oxides, SURF INT AN, 31(4), 2001, pp. 255-264
Authors:
Castle, JE
Greaves, SJ
Guascito, MR
Salvi, AM
Citation: Je. Castle et al., An X-ray photoelectron study of valence charge in transition metal aluminides, PHIL MAG A, 80(10), 2000, pp. 2425-2444
Authors:
Castle, JE
Chapman-Kpodo, H
Proctor, A
Salvi, AM
Citation: Je. Castle et al., Curve-fitting in XPS using extrinsic and intrinsic background structure, J ELEC SPEC, 106(1), 2000, pp. 65-80
Authors:
Castle, JE
Greaves, SJ
Guascito, MR
Salvi, AM
Citation: Je. Castle et al., A new probe of bonding states in intermetallic compounds, PHIL MAG A, 79(5), 1999, pp. 1109-1129
Authors:
Castle, JE
Salvi, AM
Guascito, MR
Citation: Je. Castle et al., Substrate-related feature in the loss structure of contamination C 1s, SURF INT AN, 27(8), 1999, pp. 753-760
Authors:
Salvi, AM
Castle, JE
Citation: Am. Salvi et Je. Castle, The intrinsic asymmetry component of the 'total background' in XP spectra (vol 94, pg 73, 1998), J ELEC SPEC, 97(3), 1998, pp. 265-265
Authors:
Salvi, AM
Castle, JE
Citation: Am. Salvi et Je. Castle, The intrinsic asymmetry of photoelectron peaks: dependence on chemical state and role in curve fitting (vol 95, pg 45, 1998), J ELEC SPEC, 95(2-3), 1998, pp. 299-299
Risultati:
1-10
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