Authors: Samoilenko, I Feigin, L Shchedrin, B Antolini, R

Citation: I. Samoilenko et al., Selection of a model in reflectometry: use of the linear statistical inference, PHYSICA B, 283(1-3), 2000, pp. 262-267

Authors: Fera, A Ostrovskii, BI Sentenac, D Samoilenko, I de Jeu, WH

Citation: A. Fera et al., Layer-by-layer crystallization and the role of fluctuations in free standing smectic films, PHYS REV E, 60(5), 1999, pp. R5033-R5036